BAYESIAN-ANALYSIS OF SYSTEM AVAILABILITY

被引：4

作者：

SHARMA, KK

BHUTANI, RK

机构：

[1] Department of Statistics, Institute of Advanced Studies, Meerut University, Meerut

来源：

MICROELECTRONICS AND RELIABILITY | 1993年 / 33卷 / 06期

关键词：

D O I：

10.1016/0026-2714(93)90254-V

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Various engineering systems are analysed with respect to their reliability characteristics to meet the established standards. This analysis can be further improved if the analyst is able to combine past subjective experience about the system with experimental data. In order to achieve this objective, the present study deals with the Bayesian analysis of system availability. Time-truncated failure and repair information and prior beliefs about the failure and repair rates have been used in the analysis.

引用

页码：809 / 811

页数：3