The measurement in absolute units of the intensities of X-ray reflections from crystalline powders

被引：16
作者：
Brindley, GW
机构：
来源：
PROCEEDINGS OF THE PHYSICAL SOCIETY | 1938年 / 50卷
关键词：
D O I：
10.1088/0959-5309/50/1/303
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
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页码：17 / 29
页数：13
相关论文
共 18 条
[1]  
Brentano J, 1925, P PHYS SOC LOND, V37, P184
[2]   For methodology for the quantitative measurement of the scattering of X-rays on microcrystalline layers. [J].
Brentano, J. .
ZEITSCHRIFT FUR PHYSIK, 1936, 99 (1-2) :65-72
[3]   On a procedure for direct photo parameterization low blacken and its application in the evaluation of X-ray-F-values. [J].
Brentano, J. .
ZEITSCHRIFT FUR PHYSIK, 1931, 70 (1-2) :74-83
[4]  
Brentano J, 1928, PHILOS MAG, V6, P178
[5]  
Brentano J, 1927, PHILOS MAG, V4, P620
[6]  
BRENTANO JCM, 1935, P PHYS SOC LOND, V47, P932
[7]  
Brindley GW, 1935, PHILOS MAG, V20, P893
[8]  
Brindley GW, 1935, PHILOS MAG, V20, P882
[9]  
Brindley GW, 1935, PHILOS MAG, V20, P865
[10]  
Brindley GW, 1936, PHILOS MAG, V21, P778
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