APPLICATION OF CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY IN THE CHARACTERIZATION OF ION-BEAM PROCESSED MATERIALS SURFACES

被引：1

作者：

RAI, AK

BHATTACHARYA, RS

PRONKO, PP

MAH, TI

机构：

来源：

关键词：

D O I：

10.1002/sia.740100214

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：142 / 148

页数：7

共 9 条

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RAFFOUL, C
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[2] BHATTACHARYA RS, UNPUB
[3] ION-BEAM-ENHANCED ADHESION IN THE ELECTRONIC STOPPING REGION
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QIU, Y
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[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 198 (2-3): : 607 - 609
[4] STRUCTURAL DIFFERENCE RULE FOR AMORPHOUS ALLOY FORMATION BY ION MIXING
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LAU, SS
[J]. APPLIED PHYSICS LETTERS, 1983, 42 (01) : 45 - 47
[5] AMORPHOUS FILM FORMATION BY ION MIXING IN BINARY METAL SYSTEMS
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[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 209 (MAY): : 229 - 234
[6] PRONKO PP, MRS P, V27, P559
[7] RAI AK, 1985, APPL SURF SCI, V21, P95, DOI 10.1016/0378-5963(85)90010-8
[8] RAI AK, IN PRESS J ELECTRON
[9] ION-BEAM-INDUCED ATOMIC MIXING AND AMORPHIZATION IN TI/NI BILAYERED THIN-FILMS
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[J]. JOURNAL OF APPLIED PHYSICS, 1984, 55 (12) : 4447 - 4449