ELECTROMIGRATION AND CREVICE FORMATION IN THIN METALLIC FILMS

被引：37
作者：
BLECH, IA
机构：
来源：
THIN SOLID FILMS | 1972年 / 13卷 / 01期
关键词：
D O I：
10.1016/0040-6090(72)90164-2
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
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页码：117 / &
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