LOCAL ELECTRONIC-STRUCTURE AND SURFACE GEOMETRY OF AG ON SI(111)

被引：56

作者：

DEMUTH, JE

VONLENEN, EJ

TROMP, RM

HAMERS, RJ

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1988年 / 6卷 / 01期

关键词：

D O I：

10.1116/1.584042

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：18 / 26

页数：9

共 42 条

[1]

BINNIG G, 1986, IBM J RES DEV, V30, P355

[2] 7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J].

BINNIG, G ;

ROHRER, H ;

GERBER, C ;

WEIBEL, E .

PHYSICAL REVIEW LETTERS, 1983, 50 (02) :120-123

[3] ELECTRONIC-PROPERTIES OF THE ANNEALED INTERFACE BETWEEN AG AND 7X7 SI(111) [J].

BOLMONT, D ;

CHEN, P ;

SEBENNE, CA .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1981, 14 (22) :3313-3319

[4] A SIMPLIFIED SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES [J].

DEMUTH, JE ;

HAMERS, RJ ;

TROMP, RM ;

WELLAND, ME .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03) :1320-1323

[5]

DEMUTH JE, 1987, 14TH P INT C DEF SEM, P211

[6]

FEENSTRA RA, 1986, PHYS REV LETT, V55, P608

[7]

FEENSTRA RM, 1986, PHYS REV LETT, V57, P2579

[8] THE TUNNELING MICROSCOPE - A NEW LOOK AT THE ATOMIC WORLD [J].

GOLOVCHENKO, JA .

SCIENCE, 1986, 232 (4746) :48-53

[9] SURFACE ELECTRONIC-STRUCTURE OF SI(111)-(7 X 7) RESOLVED IN REAL SPACE [J].

HAMERS, RJ ;

TROMP, RM ;

DEMUTH, JE .

PHYSICAL REVIEW LETTERS, 1986, 56 (18) :1972-1975

[10] SCANNING TUNNELING MICROSCOPY OF SI(001) [J].

HAMERS, RJ ;

TROMP, RM ;

DEMUTH, JE .

PHYSICAL REVIEW B, 1986, 34 (08) :5343-5357

← 1 2 3 4 5 →