X-RAY-DIFFRACTION CHARACTERIZATION OF WO3/SIO2, SURFACE-STRUCTURE

被引：0

作者：

BABICH, IV

ALEKSANKINA, MM

PLYUTO, YV

CHUIKO, AA

机构：

来源：

KINETICS AND CATALYSIS | 1993年 / 34卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The state of tungsten on the surface of dispersed silica during thermal treatment is studied by X-ray diffraction analysis and TGA. It is shown that the supported tungsten-oxide phase structure can vary from a structure close to WO3.2H(2)O or WO3.H2O to one characteristic of crystalline WO3. A higher level of surface hydration for WO3/SiO2 samples as compared with SiO2 is associated with the surface H2O molecules entering the composition of the supported phase.

引用

页码：493 / 495

页数：3

共 10 条

[1]

BABICH IB, 1988, DOPOV AKAD NAUK B, P35

[2] GENOTYPISCHE OXIDHYDRATE DES WOLFRAMS - ZUR FRAGE DER WOLFRAMBLAUVERBINDUNGEN [J].