SIMPLE METHOD FOR EVALUATING ELECTRONIC-PROPERTIES AT SILICON-SAPPHIRE INTERFACE

被引：7

作者：

GENTIL, P

机构：

来源：

ELECTRONICS LETTERS | 1980年 / 16卷 / 16期

关键词：

D O I：

10.1049/el:19800428

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

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页码：617 / 618

页数：2

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