BEHAVIOR AND DETECTION OF PARTICLES IN VACUUM PROCESSES

被引:24
作者
BOWLING, RA
LARRABEE, GB
机构
关键词
D O I
10.1149/1.2096667
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:497 / 502
页数:6
相关论文
共 11 条
[1]  
BAKER E, 1986, MICROCONTAMINATION, V4, P16
[2]  
BOWKER AH, 1979, ENG STATISTICS
[3]   AN ANALYSIS OF PARTICLE ADHESION ON SEMICONDUCTOR SURFACES [J].
BOWLING, RA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (09) :2208-2214
[4]  
HINDS WC, 1982, AEROSOL TECHNOLOGY, P42
[5]   QUANTITATIVE PARTICULATE CONTAMINATION STUDIES UTILIZING REDUCED TURBULENCE PUMPING AND VENTING [J].
HOH, PD .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02) :198-199
[6]  
TOLLIVER DL, 1985, ELECTROCHEMICAL SOC, P3
[7]  
TULLIS BJ, 1985, MICROCONTAMINATION, V3, P67
[8]  
TULLIS BJ, 1986, MICROCONTAMINATION 1, V4, P86
[9]  
TULLIS BJ, 1985, MICROCONTAMINATION, V3, P160
[10]  
TULLIS BJ, 1986, MICROCONTAMINATION, V4, P51