ELECTRICAL CHARACTERIZATION OF YBCO-AU THIN-FILM CONTACTS

被引：8
|
作者：
HAHN, R
KLOCKAU, J
FOTHERINGHAM, G
机构：
[1] Technol. der Mikroperipherik, Tech. Univ. Berlin
来源：
SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 1994年 / 7卷 / 05期
关键词：
D O I：
10.1088/0953-2048/7/5/016
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The area dependence of the specific contact resistivity of annealed YBCO-Au thin-film contacts has been studied and the influence of the YBCO deposition process on the annealing behaviour has been shown. The interface capacitance, inductance and resistance have been evaluated from S-parameter measurements with high precision. These measurements confirm the inhomogeneous nature of the contact interface and can be used to estimate the thickness of the insulating interface layer.
引用
收藏
页码：290 / 293
页数：4
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