DIRECT ANALYSIS OF CHEMICALLY DISORDERED COMPOUNDS BY INVERTED TENSOR LEED

被引：13

作者：

DOLL, R ^{[1
]}

KOTTCKE, M ^{[1
]}

HEINZ, K ^{[1
]}

机构：

[1] UNIV ERLANGEN NURNBERG,LEHRSTUHL FESTKORPERPHYS,STAUDTSTR 7,D-91058 ERLANGEN,GERMANY

来源：

SURFACE SCIENCE | 1994年 / 304卷 / 03期

关键词：

D O I：

10.1016/0039-6028(94)91341-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We propose a method to evaluate measured LEED intensities of substitutionally disordered compounds to yield directly the layer-dependent deviations from the bulk stoichiometry. The method is based on tensor LEED and its modification to simulate the substitution of surface atoms. It is tested via comparison with theoretical data as well as via the application to experimental spectra from substitutionally disordered alloys. The new approach promises large savings of computer time, particularly when complicated structures are under consideration.

引用

页码：309 / 315

页数：7

共 21 条

[1]

BAUDOING R, 1986, J PHYS C SOLID STATE, V19, P2825, DOI 10.1088/0022-3719/19/16/003

[2] LEED SURFACE CRYSTALLOGRAPHY, R-FACTORS AND THE STRUCTURE OF THE (110) SURFACES OF III-V-SEMICONDUCTORS [J].

COWELL, PG ;

PRUTTON, M ;

TEAR, SP .

SURFACE SCIENCE, 1986, 177 (01) :L915-L924

[3]

CRAMPIN S, 1991, SURF SCI, V244, pL137, DOI 10.1016/0039-6028(91)90486-C

[4]

DAVIS HL, 1991, B AM PHYS SOC, V36, P705

[5] CHEMICAL SUBSTITUTION OF SURFACE ATOMS IN STRUCTURE DETERMINATION BY TENSOR LOW-ENERGY-ELECTRON DIFFRACTION [J].

DOLL, R ;

KOTTCKE, M ;

HEINZ, K .

PHYSICAL REVIEW B, 1993, 48 (03) :1973-1976

[6]

DOLL R, IN PRESS SURF SCI

[7]

GAUTHIER Y, 1990, LOW ENERGY ELECTRON, P169

[8] DIFFUSE LEED AND SURFACE CRYSTALLOGRAPHY [J].

HEINZ, K ;

SALDIN, DK ;

PENDRY, JB .

PHYSICAL REVIEW LETTERS, 1985, 55 (21) :2312-2315

[9] DIFFUSE INTENSITIES IN LEED [J].

HEINZ, K .

VACUUM, 1990, 41 (1-3) :328-332

[10]

KLEINLE G, 1989, SURF SCI, V219, pL637, DOI 10.1016/0039-6028(89)90512-8

← 1 2 3 →