A real-time imaging system for the detection of photons from the infrared to X-ray region of the electromagnetic spectrum has been developed. The active detection element in the system is a charge coupled device (CCD). The system, based on the Computer Automated Measurement And Control (CAMAC) modular IEEE 583 standard in which all modules are programmable, allows one to use the detector in many modes, as described below. Further, the programmability also enables one to easily change the waveform shapes and timings vs the readout requirements of CCDs from different vendors. Three different CCDs with radically different readout timings and waveforms have been tested. The CCD that is characterized and described in this paper is the TC 215 manufactured by Texas Instruments (TI). Uniformity, charge transfer efficiency (CTE), linearity and sensitivity measurements have been carried out using visible light. Preliminary data obtained from a time-resolved experiment performed at the NSLS X6 beamline is shown and potential time-resolved experiments that are feasible are described.