HOT-CARRIER SCREENING IN SEMICONDUCTORS - A BOLTZMANN-EQUATION APPROACH

被引：12

作者：

HU, BYK ^{[1
]}

WILKINS, JW ^{[1
]}

机构：

[1] CORNELL UNIV, ATOM & SOLID STATE PHYS LAB, ITHACA, NY 14853 USA

来源：

PHYSICAL REVIEW B | 1989年 / 39卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.39.8464

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：8464 / 8467

页数：4

共 26 条

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PHYSICAL REVIEW B, 1989, 39 (12) :8468-8475

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