OXYGEN DISTRIBUTION PROFILES IN THIN EVAPORATED CONTACTS ON SINGLE-CRYSTAL SILICON

被引:20
作者
PETERSSON, S [1 ]
NORDE, H [1 ]
POSSNERT, G [1 ]
ORRE, B [1 ]
机构
[1] INST PHYS,S-75121 UPPSALA,SWEDEN
来源
NUCLEAR INSTRUMENTS & METHODS | 1978年 / 149卷 / 1-3期
关键词
D O I
10.1016/0029-554X(78)90874-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:285 / 288
页数:4
相关论文
共 12 条
[1]   7ICROANALYSIS BY DIRECT OBSERVATION OF NUCLEAR REACTIONS USING A 2 MEV VAN-DE-GRAAFF [J].
AMSEL, G ;
NADAI, JP ;
DARTEMAR.E ;
DAVID, D ;
GIRARD, E ;
MOULIN, J .
NUCLEAR INSTRUMENTS & METHODS, 1971, 92 (04) :481-&
[2]   PRINCIPLES AND APPLICATIONS OF ION-BEAM TECHNIQUES FOR ANALYSIS OF SOLIDS AND THIN-FILMS [J].
CHU, WK ;
MAYER, JW ;
NICOLET, MA ;
BUCK, TM ;
AMSEL, G ;
EISEN, F .
THIN SOLID FILMS, 1973, 17 (01) :1-41
[3]  
CHU WK, 1975, NEW USES ION ACCELER, P135
[4]   A RADIOCHEMICAL TECHNIQUE FOR STUDYING RANGE-ENERGY RELATIONSHIPS FOR HEAVY IONS OF KEV ENERGIES IN ALUMINUM [J].
DAVIES, JA ;
FRIESEN, J ;
MCINTYRE, JD .
CANADIAN JOURNAL OF CHEMISTRY-REVUE CANADIENNE DE CHIMIE, 1960, 38 (09) :1526-1534
[5]  
DEARNLY G, 1973, ION IMPLANTATION SEM, P405
[6]  
EISELE K, 1976, INT S VACUUM THIN FI
[7]   SURFACE BARRIER PARTICLE DETECTORS [J].
HANSEN, NJ ;
SCOTT, RG ;
HENDERSON, DJ .
NUCLEAR INSTRUMENTS & METHODS, 1972, 104 (02) :333-+
[8]   POTENTIALS AND DIRECT-CURRENT IN SI-(20 TO 40 A)SIO2-METAL STRUCTURES [J].
KAR, S ;
DAHLKE, WE .
SOLID-STATE ELECTRONICS, 1972, 15 (08) :869-&
[9]  
LHOIR A, 1960, CAN J CHEM, V38, P965
[10]  
MEZEY G, 1976, ION BEAM SURFACE LAY, P303