A METHOD OF DATA-PROCESSING FOR X-RAY L-EDGE ABSORPTION

A method of data processing for the rare earth (RE) L-edge X-ray absorption spectrum in materials is presented. Mathematical analyses show that if the L-edge is decomposed into a Lorentzian line and an arctan curve, their second derivatives are very different and the former represents a symmetric negative peak at the same location as the original Lorentzian peak. The white line (WL) in the RE L-edge can be separated without decomposition of the edge. This method simplifies the data processing and reduces some artificial factors in data processing. The RE L-edges in some fluorides and glasses are analyzed by this method and the ordinary method. The changes in the WL intensities at the L-edges of various materials, which are obtained by two data processing, are consistent to each other.