PREOPTIC TEMPERATURE AND DURATION OF FAST-WAVE SLEEP EPISODES

被引：0
|
作者：
PARMEGGI.PL [1 ]
ZAMBONI, G [1 ]
CIANCI, T [1 ]
RICCI, C [1 ]
机构：
[1] IST FISIOL UMANA,40127 BOLOGNA,ITALY
来源：
EXPERIENTIA | 1973年 / 29卷 / 06期
关键词：
D O I：
暂无
中图分类号：
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号：
07 ; 0710 ; 09 ;
摘要：
引用
收藏
页码：747 / 747
页数：1
相关论文
共 50 条
  • [1] INFLUENCE OF PREOPTIC HEATING ON DURATION OF FAST WAVE SLEEP EPISODES IN CAT
    PARMEGGIANI, PL
    CIANCI, T
    ZAMBONI, G
    BOLLETTINO DELLA SOCIETA ITALIANA DI BIOLOGIA SPERIMENTALE, 1972, 48 (24): : 1216 - 1218
  • [2] INFLUENCE OF ANTERIOR HYPOTHALAMIC HEATING ON DURATION OF FAST WAVE SLEEP EPISODES
    PARMEGGIANI, PL
    ZAMBONI, G
    CIANCI, T
    AGNATI, LF
    RICCI, C
    ELECTROENCEPHALOGRAPHY AND CLINICAL NEUROPHYSIOLOGY, 1974, 36 (05): : 465 - 470
  • [3] MULTIUNIT ACTIVITY WITH EYE-MOVEMENTS DURING FAST-WAVE SLEEP IN CATS
    MUNSON, JB
    EXPERIMENTAL NEUROLOGY, 1972, 37 (02) : 446 - &
  • [4] Characteristics and applications of fast-wave gyrodevices
    Felch, KL
    Danly, BG
    Jory, HR
    Kreischer, KE
    Lawson, W
    Levush, B
    Temkin, RJ
    PROCEEDINGS OF THE IEEE, 1999, 87 (05) : 752 - 781
  • [5] THE LASING MECHANISM IN FAST-WAVE DEVICES
    DOHLER, G
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (03) : 386 - 389
  • [6] THEORY OF FAST-WAVE PARAMETRIC AMPLIFICATION
    JOHNSON, CC
    JOURNAL OF APPLIED PHYSICS, 1960, 31 (02) : 338 - 345
  • [7] SCATTERING RESONANCES ON A FAST-WAVE STRUCTURE
    LI, RCM
    OLINER, AA
    IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 1965, AP13 (06) : 948 - +
  • [8] PHYSICS AND CLASSIFICATION OF FAST-WAVE DEVICES
    DOHLER, G
    FRIZ, W
    INTERNATIONAL JOURNAL OF ELECTRONICS, 1983, 55 (04) : 505 - 521
  • [9] FAST-WAVE CURRENT DRIVE IN A TOROIDAL PLASMA
    GOREE, J
    ONO, M
    COLESTOCK, P
    HORTON, R
    MCNEILL, D
    PARK, H
    PHYSICAL REVIEW LETTERS, 1985, 55 (16) : 1669 - 1672
  • [10] COUPLING IMPEDANCES IN SYNCHRONOUS FAST-WAVE DEVICES
    DOHLER, G
    FRIZ, W
    INTERNATIONAL JOURNAL OF ELECTRONICS, 1983, 55 (04) : 523 - 532
12345