THE AGING OF ELECTRICAL INSULATION AT CRYOGENIC TEMPERATURES

被引：1
作者：
BULINSKI, A
DENSLEY, J
SUDARSHAN, TS
机构：
来源：
IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1981年 / 16卷 / 02期
关键词：
D O I：
10.1109/TEI.1981.298346
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：83 / 88
页数：6
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