THE AGING OF ELECTRICAL INSULATION AT CRYOGENIC TEMPERATURES

被引：1

作者：

BULINSKI, A

DENSLEY, J

SUDARSHAN, TS

机构：

来源：

IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1981年 / 16卷 / 02期

关键词：

D O I：

10.1109/TEI.1981.298346

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：83 / 88

页数：6

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