ELECTRONICALLY-SCANNED WHITE-LIGHT INTERFEROMETRY WITH ENHANCED DYNAMIC-RANGE

被引：20

作者：

CHEN, S ^{[1
]}

MEGGITT, BT ^{[1
]}

ROGERS, AJ ^{[1
]}

机构：

[1] SIRA INST LTD,CHISLEHURST BR7 5EH,KENT,ENGLAND

来源：

ELECTRONICS LETTERS | 1990年 / 26卷 / 20期

关键词：

Interferometers; Measurement;

D O I：

10.1049/el:19901065

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

When a CCD array is used to detect the spatial fringes of optical interference, interesting features emerge in the output as the width of each fringe approaches the dimension of a CCD sensing cell. These features are theoretically studied and their application to the enhancement of the dynamic operating range of electrically scanned white-light interferometry is investigated. Preliminary experimental results are presented. © 1990, The Institution of Electrical Engineers. All rights reserved.

引用

页码：1663 / 1665

页数：3

共 6 条

[1] NOVEL ELECTRONIC SCANNER FOR COHERENCE MULTIPLEXING IN A QUASI-DISTRIBUTED PRESSURE SENSOR [J].