THE CHOICE OF SPECTROSCOPIC SCHEME IN X-RAY PLASMA DIAGNOSTICS

被引：5
作者：
RENNER, O
KOPECKY, M
机构：
[1] Institute of Physics, Czechosl. Acad. Sci., Praha 8, 180 40
来源：
CZECHOSLOVAK JOURNAL OF PHYSICS | 1990年 / 40卷 / 10期
关键词：
D O I：
10.1007/BF01597971
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The ray tracing codes for flat, cylindrically bent (Johann horizontal focusing and von Hamos vertical focusing geometry), elliptically and spherically bent crystal spectrometers were developed. The codes, extended by introducing the two-dimensional source and the real shape of single crystal diffraction pattern in dependence on the radius of curvature, contribute to a proper choice of experimental configuration in x-ray plasma diagnostics. A method of ray tracing the von Hamos spectrometer is presented in detail. The use of the ray tracing code to the optimization of the spectroscopic scheme is demonstrated on the analysis of gas-puff z-pinch experiment. © 1990 Academia, Publishing House of the Czechoslovak Academy of Sciences.
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收藏
页码：1107 / 1116
页数：10
相关论文
共 11 条
[1]   INTERPRETATION OF SOME EXPERIMENTAL-DATA CONCERNING BENT MONOCHROMATORS FOR SYNCHROTRON X-RAY-RADIATION [J].
BOEUF, A ;
MELONE, S ;
PULITI, P ;
RUSTICHELLI, F .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1978, 11 (AUG) :265-267
[2]  
Boiko V. A., 1985, Journal of Soviet Laser Research, V6, P85, DOI 10.1007/BF01885411
[3]   LASER GENERATED PLASMA AS A SOURCE FOR REAL-TIME STUDIES IN X-RAY CRYSTAL RESEARCH .1. FUNDAMENTAL REMARKS ABOUT SOURCE CHARACTERISTICS AND REQUIREMENTS [J].
FORSTER, E ;
GOETZ, K ;
SCHAFER, K ;
ZIMMER, WD .
LASER AND PARTICLE BEAMS, 1984, 2 (MAY) :167-185
[4]  
HENKE BL, 1987, XRAY OPTICS MICROANA
[5]   A COMPARISON OF ALTERNATIVE SCHEMES FOR DISPERSIVE MODE X-RAY ABSORPTION-SPECTROSCOPY [J].
KOPECKY, M ;
RENNER, O .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1989, 282 (2-3) :719-724
[6]  
KOPECKY M, 1988, THESIS CZECH TECH U
[7]  
KREJCI A, 1989, 19 P ICPIG BELGR
[8]   RAY TRACING OF A CONCAVE-CURVED-CRYSTAL SPECTROMETER AND ITS DETAILED CHARACTERISTICS FOR X-RAY SPECTROSCOPIC DIAGNOSTICS OF HIGH-TEMPERATURE PLASMAS [J].
MORITA, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (06) :1030-1040
[9]  
RENNER O, 1987, 18TH ECLIM PRAG
[10]   ION-INDUCED X-RAY STUDIES WITH A HIGH LUMINOSITY VONHAMOS CRYSTAL SPECTROMETER [J].
VANE, CR ;
SMITH, M ;
RAMAN, S ;
HEARD, J ;
WALKIEWICZ, T .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 24-5 :59-63
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