DESIGN AND PERFORMANCE OF AN INTEGRATED CIRCUIT FLIP FLOP WITH PHOTOCURRENT COMPENSATION

被引：1

作者：

AIKEN, JG

CRABBE, JS

SPENCE, HW

KINOSHITA, G

PHILLIPS, H

机构：

[1] Texas Instruments Incorporated, Dallas, Texas

[2] Autonetics, Anaheim, California

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1969年 / NS16卷 / 06期

关键词：

D O I：

10.1109/TNS.1969.4325523

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The design and testing of a dielectrically isolated integrated circuit Set-Reset (RS) flip flop is described. The flip flops were fabricated with bipolar transistors having a primary photocurrent sensitivity of 3–5 x 10 mA/rad(Si)/s. The flip flops were capable of being switched on clock command during a 400 nsec electron beam pulse with a peak dose rate of 1.6 x 10 rad(Si)/s. Copyright © 1969 by The Institute of Electrical and Electronics Engineers, Inc.

引用

页码：177 / +

页数：1