HIGH-PRESSURE PROPERTIES OF WURTZITE-TYPE AND ROCK-SALT-TYPE ALUMINUM NITRIDE

被引:159
作者
VANCAMP, PE
VANDOREN, VE
DEVREESE, JT
机构
[1] University of Antwerp, Rijksuniversitair Centrum Antwerpen, B-2020 Antwerpen
来源
PHYSICAL REVIEW B | 1991年 / 44卷 / 16期
关键词
D O I
10.1103/PhysRevB.44.9056
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Electronic and ground-state properties of both wurtzite- and rocksalt-structure AlN are evaluated in the local-density-functional formalism using nonlocal norm-conserving pseudopotentials. For the wurtzite structure we obtain a = 3.129 angstrom and c = 4.988 angstrom and an internal parameter of 0.3825, which deviates considerably from the ideal value. In the case of the rocksalt structure we get a = 4.032 angstrom. Both modifications are large-band-gap semiconductors with a direct gap in the wurtzite structure and an indirect gap in the rocksalt structure. The transition pressure from hexagonal to cubic was calculated to be 12.9 GPa, in reasonable agreement with the experimental value.
引用
收藏
页码:9056 / 9059
页数:4
相关论文
共 17 条
[1]   FINITE STRAIN ISOTHERM AND VELOCITIES FOR SINGLE-CRYSTAL AND POLYCRYSTALLINE NACL AT HIGH-PRESSURES AND 300-DEGREE-K [J].
BIRCH, F .
JOURNAL OF GEOPHYSICAL RESEARCH, 1978, 83 (NB3) :1257-1268
[2]  
BLACKSLEE OL, 1970, J APPL PHYS, V41, P3373
[3]   ELECTRONIC-STRUCTURE OF ALN [J].
CHING, WY ;
HARMON, BN .
PHYSICAL REVIEW B, 1986, 34 (08) :5305-5308
[4]   BONDING AND IONICITY IN SEMICONDUCTORS [J].
CHRISTENSEN, NE ;
SATPATHY, S ;
PAWLOWSKA, Z .
PHYSICAL REVIEW B, 1987, 36 (02) :1032-1050
[5]  
CHRISTENSEN NE, UNPUB
[6]  
DEVREESE JT, 1985, ELECTRONIC STRUCTURE
[7]   X-RAY-DIFFRACTION DETERMINATION OF VALENCE-ELECTRON DENSITY IN ALUMINUM NITRIDE [J].
GABE, E ;
LEPAGE, Y ;
MAIR, SL .
PHYSICAL REVIEW B, 1981, 24 (10) :5634-5641
[8]  
HYBERTSEN M, 1986, PHYS REV B, V34, P530
[9]   1ST-PRINCIPLES THEORY OF QUASIPARTICLES - CALCULATION OF BAND-GAPS IN SEMICONDUCTORS AND INSULATORS [J].
HYBERTSEN, MS ;
LOUIE, SG .
PHYSICAL REVIEW LETTERS, 1985, 55 (13) :1418-1421
[10]  
PERRY B, 1978, APPL PHYS LETT, V33, P319