共 14 条
[2]
ASAUSKAS R, 1980, SOV PHYS SEMICOND+, V14, P1377
[4]
QUANTITATIVE AUGER ANALYSIS BY DEPTH PROFILING OF LINE-SHAPES - APPLICATION TO NATIVE OXIDE-INSB INTERFACES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1985, 3 (04)
:959-963
[5]
STUDIES OF SIOX ANODIC NATIVE OXIDE INTERFACES ON INSB
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1986, 4 (05)
:1195-1202
[6]
EVALUATION OF INSB MOS STRUCTURE WITH THIN ANODIC OXIDE
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS,
1984, 23 (01)
:L46-L48
[7]
CHARACTERIZATION OF IMPROVED INSB INTERFACES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1979, 16 (05)
:1474-1477