SCATTERING-THEORETIC METHOD FOR DEFECTS AND IMPURITIES IN SEMICONDUCTORS

被引：0

作者：

BERNHOLC, J ^{[1
]}

PANTELIDES, ST ^{[1
]}

LIPARI, NO ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1978年 / 23卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：214 / 214

页数：1

共 50 条

[1] SCATTERING-THEORETIC METHOD FOR SURFACES AND INTERFACES OF SEMICONDUCTORS
POLLMANN, J
PANTELIDES, ST
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (03): : 400 - 400
[2] SCATTERING-THEORETIC METHOD FOR DEFECTS IN SEMICONDUCTORS .2. SELF-CONSISTENT FORMULATION AND APPLICATION TO THE VACANCY IN SILICON
BERNHOLC, J
LIPARI, NO
PANTELIDES, ST
PHYSICAL REVIEW B, 1980, 21 (08): : 3545 - 3562
[3] SCATTERING-THEORETIC METHOD FOR DEFECTS IN SEMICONDUCTORS .1. TIGHT-BINDING DESCRIPTION OF VACANCIES IN SI, GE, AND GAAS
BERNHOLC, J
PANTELIDES, ST
PHYSICAL REVIEW B, 1978, 18 (04): : 1780 - 1789
[4] GREENS FUNCTION SCATTERING-THEORETIC METHODS FOR POINT-DEFECTS, SURFACES, AND INTERFACES IN SOLIDS
PANTELIDES, ST
BERNHOLC, J
POLLMANN, J
LIPARI, NO
INTERNATIONAL JOURNAL OF QUANTUM CHEMISTRY, 1978, 12 : 507 - 521
[5] SCATTERING-THEORETIC APPROACH TO THE ELECTRONIC-STRUCTURE OF SEMICONDUCTOR SURFACES - (100) SURFACE OF TETRAHEDRAL SEMICONDUCTORS AND SIO2
POLLMANN, J
PANTELIDES, ST
PHYSICAL REVIEW B, 1978, 18 (10) : 5524 - 5544
[6] SCATTERING BY IONIZED IMPURITIES IN SEMICONDUCTORS
BROOKS, H
PHYSICAL REVIEW, 1951, 83 (04): : 879 - 879
[7] Interaction of hydrogen with impurities and defects in semiconductors
Chevallier, J
Pajot, B
DEFECT INTERACTION AND CLUSTERING IN SEMICONDUCTORS, 2002, 85-86 : 203 - 283
[8] Interaction of hydrogen with impurities and defects in semiconductors
Chevallier, J.
Pajot, B.
Solid State Phenomena, 2002, 85-86 : 203 - 284
[9] PHOTOLUMINESCENCE CHARACTERIZATION OF IMPURITIES AND DEFECTS IN SEMICONDUCTORS
NISHINO, T
NAKAYAMA, H
HAMAKAWA, Y
JAPAN ANNUAL REVIEWS IN ELECTRONICS COMPUTERS & TELECOMMUNICATIONS, 1983, 8 : 295 - 310
[10] ELECTRON SCATTERING BY IMPURITIES IN SEMICONDUCTORS.
Otsuka, Eizo
Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes, 1986, 25 (03): : 303 - 317

← 1 2 3 4 5 →