共 50 条
- [42] Study of point defect concentrations during the fluorinated oxidation of silicon DEFECTS AND DIFFUSION IN SILICON PROCESSING, 1997, 469 : 71 - 76
- [43] SHALLOW JUNCTIONS - MODELING THE DOMINANCE OF POINT-DEFECT CHARGE STATES DURING TRANSIENT DIFFUSION 1989 INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST, 1989, : 691 - 694
- [45] SOLID-PHASE REGROWTH OF AMORPHOUS-SILICON LAYERS IN THE PRESENCE OF THE POINT-DEFECT FLUX NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1989, 39 (1-4): : 366 - 369
- [49] EPR STUDIES OF POINT-DEFECT AND AMORPHOUS PHASE PRODUCTION DURING ION-IMPLANTATION IN SILICON RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1979, 42 (1-2): : 23 - 28