STRUCTURE OF MOLTEN SILICON AND GERMANIUM BY X-RAY-DIFFRACTION

被引:201
|
作者
WASEDA, Y [1 ]
SUZUKI, K [1 ]
机构
[1] TOHOKU UNIV, RES INST MINERAL DRESSING & MET, SENDAI 980, JAPAN
来源
关键词
D O I
10.1007/BF01313204
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
引用
收藏
页码:339 / 343
页数:5
相关论文
共 50 条
  • [41] X-ray-diffraction investigation of the anodic oxidation of porous silicon
    Buttard, D
    Bellet, D
    Dolino, G
    JOURNAL OF APPLIED PHYSICS, 1996, 79 (10) : 8060 - 8070
  • [42] X-RAY-DIFFRACTION STUDY OF SILICON IMPLANTATED WITH BORON IONS
    STELMAKH, VF
    TKACHEV, VD
    CHELYADINSKII, AR
    FIZIKA TVERDOGO TELA, 1978, 20 (07): : 2196 - 2200
  • [43] X-RAY-DIFFRACTION CHARACTERIZATION OF SILICON-ON-INSULATOR FILMS
    THOMPSON, LR
    COLLINS, GJ
    DOYLE, BL
    KNAPP, JA
    JOURNAL OF APPLIED PHYSICS, 1991, 70 (09) : 4760 - 4769
  • [44] X-RAY-DIFFRACTION STUDY OF THIN POROUS SILICON LAYERS
    LOMOV, AA
    BELLET, D
    DOLINO, G
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1995, 190 (01): : 219 - 226
  • [45] X-RAY-DIFFRACTION STUDIES OF DEFECTS IN EPITAXIAL SILICON ON SAPPHIRE
    ROLLAND, G
    GONCHOND, JP
    TRILHE, J
    ACTA CRYSTALLOGRAPHICA SECTION A, 1978, 34 : S271 - S271
  • [46] X-ray diffraction study of undercooled molten silicon
    Kimura, H
    Watanabe, M
    Izumi, K
    Hibiya, T
    Holland-Moritz, D
    Schenk, T
    Bauchspiess, KR
    Schneider, S
    Egry, I
    Funakoshi, K
    Hanfland, M
    APPLIED PHYSICS LETTERS, 2001, 78 (05) : 604 - 606
  • [47] STRUCTURE FACTOR DETERMINATION IN SURFACE X-RAY-DIFFRACTION
    ROBINSON, IK
    AUSTRALIAN JOURNAL OF PHYSICS, 1988, 41 (03): : 359 - 367
  • [48] X-RAY-DIFFRACTION AND STRUCTURE OF IONIC-SOLUTIONS
    MARQUES, MA
    DEBARROS.MI
    PROCEEDINGS OF THE KONINKLIJKE NEDERLANDSE AKADEMIE VAN WETENSCHAPPEN SERIES B-PALAEONTOLOGY GEOLOGY PHYSICS CHEMISTRY ANTHROPOLOGY, 1974, 77 (04): : 286 - 302
  • [49] X-RAY-DIFFRACTION STUDIES ON THE STRUCTURE OF HYDRATED COLLAGEN
    SASAKI, N
    SHIWA, S
    YAGIHARA, S
    HIKICHI, K
    BIOPOLYMERS, 1983, 22 (12) : 2539 - 2547
  • [50] A STUDY OF THE STRUCTURE OF WOOD CELLS BY X-RAY-DIFFRACTION
    PAAKKARI, T
    SERIMAA, R
    WOOD SCIENCE AND TECHNOLOGY, 1984, 18 (02) : 79 - 85