ADVANCES IN ATOM-PROBE FIELD-ION MICROSCOPY

被引：0

作者：

MULLER, EW ^{[1
]}

机构：

[1] PENN STATE UNIV,DEPT PHYS,UNIVERSITY PK,PA 16801

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1974年 / 100卷 / MAR期

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D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：121 / 131

页数：11

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