HIGH-RESOLUTION PHOTOACOUSTIC THERMAL-WAVE MICROSCOPY

被引：149

作者：

ROSENCWAIG, A ^{[1
]}

BUSSE, G ^{[1
]}

机构：

[1] HSCH BUNDESWEHR MUNCHEN,ZWE PHYS,D-8014 NEUBIBERG,FED REP GER

来源：

APPLIED PHYSICS LETTERS | 1980年 / 36卷 / 09期

关键词：

D O I：

10.1063/1.91646

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：725 / 727

页数：3

共 7 条

[1] SUBSURFACE IMAGING WITH PHOTOACOUSTICS [J].

BUSSE, G ;

ROSENCWAIG, A .

APPLIED PHYSICS LETTERS, 1980, 36 (10) :815-816

[2]

LUUKKALA M, 1979, ELECTRON LETT, V15, P326

[3]

ROSENCWAIG A, 1979, AM LAB, V11, P39

[4]

ROSENCWAIG A, UNPUBLISHED

[5] SUBSURFACE FLAW DETECTION IN METALS BY PHOTOACOUSTIC MICROSCOPY [J].

THOMAS, RL ;

POUCH, JJ ;

WONG, YH ;

FAVRO, LD ;

KUO, PK ;

ROSENCWAIG, A .

JOURNAL OF APPLIED PHYSICS, 1980, 51 (02) :1152-1156

[6] PHOTO-ACOUSTICS ON A MICROSCOPIC SCALE [J].

WICKRAMASINGHE, HK ;

BRAY, RC ;

JIPSON, V ;

QUATE, CF ;

SALCEDO, JR .

APPLIED PHYSICS LETTERS, 1978, 33 (11) :923-925

[7] SUBSURFACE STRUCTURES OF SOLIDS BY SCANNING PHOTOACOUSTIC MICROSCOPY [J].

WONG, YH ;

THOMAS, RL ;

POUCH, JJ .

APPLIED PHYSICS LETTERS, 1979, 35 (05) :368-369

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