ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY AS A NONINVASIVE CHARACTERIZATION TECHNIQUE FOR THE SURFACE REGION OF PROCESSED (HG, CD)TE

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作者：

SEELMANNEGGEBERT, M

RICHTER, HJ

ZIEGLER, J

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FUTURE INFRARED DETECTOR MATERIALS | 1989年 / 1106卷

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O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

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页码：181 / 189

页数：9

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