ANGLE-RESOLVED X-RAY PHOTOELECTRON-SPECTROSCOPY AS A NONINVASIVE CHARACTERIZATION TECHNIQUE FOR THE SURFACE REGION OF PROCESSED (HG, CD)TE

被引：0
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作者：
SEELMANNEGGEBERT, M
RICHTER, HJ
ZIEGLER, J
机构：
来源：
FUTURE INFRARED DETECTOR MATERIALS | 1989年 / 1106卷
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中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
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页码：181 / 189
页数：9
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