QUANTIFICATION OF THE COMPOSITION OF ALLOY AND OXIDE SURFACES USING LOW-ENERGY ION-SCATTERING

被引:45
|
作者
JACOBS, JP
REIJNE, S
ELFRINK, RJM
MIKHAILOV, SN
BRONGERSMA, HH
WUTTIG, M
机构
[1] EINDHOVEN UNIV TECHNOL, SCHUIT INST CATALYSIS, 5600 MB EINDHOVEN, NETHERLANDS
[2] FORSCHUNGSZENTRUM JULICH, IGV FORSCHUNGSZENTRUM, W-5170 JULICH 1, GERMANY
来源
关键词
D O I
10.1116/1.579204
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The influence of the chemical environment on the low-energy ion scattering (LEIS) intensities from aluminum and nickel is investigated by studying a number of different alloys (Ag80Al20, Ni80Pt20, NiAl{110}) and oxides (gamma-Al2O3, alpha-Al2O3, alpha-Al2O3 sapphire {1102BAR), NiO, 14 wt % Ni/gamma-Al2O3). The neutralization behavior of the He ions scattered from Al and Ni in alloys was found to be the same as for the metals. Even for the oxides, where the chemical environment of Al and Ni is radically different from that of the pure metals, the scattered ion fractions are unaffected. For NiAl{110}, however, He ions scattered from Al in the alloy show a significant lower neutralization probability in comparison to the pure Al. This was attributed to the difference in chemical environment. It will be shown that the influence of surface roughness on the LEIS-signal intensity can be quantified. Furthermore, this influence can be neglected when comparing pressed powders having different surface morphologies.
引用
收藏
页码:2308 / 2313
页数:6
相关论文
共 50 条
  • [41] LOW-ENERGY ION-SCATTERING ANALYSIS OF THE GAAS(001) SURFACE
    ORRMANROSSITER, KG
    ALBAYATI, AH
    ARMOUR, DG
    SURFACE SCIENCE, 1990, 225 (03) : 341 - 354
  • [42] Low-Energy Ion-Scattering Spectroscopy of Modified Silicate Glasses
    Almeida, Rui M.
    Jain, Himanshu
    Pantano, Carlo G.
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2016, 99 (04) : 1259 - 1265
  • [43] TEMPERATURE EFFECTS IN LOW-ENERGY ION-SCATTERING FROM COPPER
    ENGELMANN, G
    TAGLAUER, E
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 2 (1-3): : 436 - 439
  • [44] SEMIEMPIRICAL MODELING OF THE BACKGROUND IN LOW-ENERGY ION-SCATTERING SPECTRA
    NELSON, GC
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03): : 1567 - 1569
  • [45] LOW-ENERGY ION-SCATTERING FROM THE AU(110) SURFACE
    MOLLER, J
    SNOWDON, KJ
    HEILAND, W
    NIEHUS, H
    SURFACE SCIENCE, 1986, 178 (1-3) : 475 - 482
  • [46] LOW-ENERGY ION-SCATTERING FOR THE DETERMINATION OF THE LOCATIONS OF SURFACE ATOMS
    NIEHUS, H
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 218 (1-3): : 230 - 234
  • [47] LOW-ENERGY ION-SCATTERING STUDY OF ADSORPTION AND DESORPTION PROCESSES OF PB ON SI(111) SURFACES
    SAITOH, M
    OURA, K
    ASANO, K
    SHOJI, F
    HANAWA, T
    SURFACE SCIENCE, 1985, 154 (2-3) : 394 - 416
  • [48] INELASTIC EFFECT IN LOW-ENERGY HE+ ION-SCATTERING FROM SOLID-SURFACES
    SHOJI, F
    HANAWA, T
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 2 (1-3): : 401 - 405
  • [49] CHARGE-EXCHANGE IN LOW-ENERGY HE+ ION-SCATTERING FROM SOLID-SURFACES
    VANDENOETELAAR, RJA
    FLIPSE, CFJ
    PHYSICAL REVIEW B, 1995, 52 (15): : 10807 - 10810
  • [50] STRUCTURE EFFECTS IN LOW-ENERGY K+ ION-SCATTERING FROM SINGLE-CRYSTAL SURFACES
    VONDEMHAGEN, T
    HOU, M
    BAUER, E
    SURFACE SCIENCE, 1982, 117 (1-3) : 134 - 141