HIGH-RESOLUTION POWDER DIFFRACTION STUDIES OF POLYCRYSTALLINE MATERIALS

被引:19
作者
FITCH, AN
机构
[1] ESRF, 38043 Grenoble Cedex
关键词
D O I
10.1016/0168-583X(94)00409-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Large improvements have been made in the quality of powder diffraction data by the use of synchrotron radiation. This has led to enhancements in the traditional areas such as phase analysis, peak broadening studies and strain measurements, and also opened up possibilities for dynamic and time-resolved investigations of phase changes or solid-state reactions, and the solving and refining of crystal structures from powder data. Some general aspects of these developments are described. At the European Synchrotron Radiation Facility, Grenoble, France, a powder diffraction beam line is under construction. A description of the beam-line configuration and its performance spefications is given. The new instrument will have very high angular and energy resolution and will lead to further increases in the scope for powder diffraction measurements.
引用
收藏
页码:63 / 69
页数:7
相关论文
共 25 条
[1]  
Huang, Hart, Parrish, Masciocchi, J. Appl. Phys., 61, (1987)
[2]  
Wilkinson, Cheetham, J. Phys. Chem. Solids, 52, (1991)
[3]  
Fitch, Catlow, Atkinson, J. Mat. Sci., 26, (1991)
[4]  
Cox, Hastings, Cardoso, Synchrotron X-Ray Powder Diffraction at X13A: A Dedicated Powder Diffractometer at the National Synchrotron Light Source, Materials Science Forum, 9, (1986)
[5]  
Pattison, Cernik, Clarke, Rev. Sci. Instr., 60, (1989)
[6]  
Bushnell-Wye, Cernik, Rev. Sci. Instr., 63, (1992)
[7]  
Cernik, Murray, Pattison, Fitch, A two-circle powder diffractometer for synchrotron radiation with a closed loop encoder feedback system, Journal of Applied Crystallography, 23, (1990)
[8]  
Collins, Cernik, Pattison, Bell, Fitch, Rev. Sci. Instr., 63, (1992)
[9]  
Arnold, Bartl, Fuess, Kosten, Lochner, Pennartz, Prandl, Wroblewski, Rev. Sci. Instr., 60, (1989)
[10]  
Lochner, Pennartz, Miehe, Fuess, Synchrotron powder diffractometry at Hasylab/DORIS reviewed, Zeitschrift für Kristallographie, 204, (1993)