HIGH-SPEED INTEGRATED-CIRCUIT CHARACTERIZATION AND TEST STRATEGY

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作者：

MUEHLDORF, EI

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SOLID STATE TECHNOLOGY | 1980年 / 23卷 / 09期

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TM [电工技术]; TN [电子技术、通信技术];

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0808 ; 0809 ;

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页码：93 / 98

页数：6

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