HIGH-SPEED INTEGRATED-CIRCUIT CHARACTERIZATION AND TEST STRATEGY

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作者：
MUEHLDORF, EI
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SOLID STATE TECHNOLOGY | 1980年 / 23卷 / 09期
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码：93 / 98
页数：6
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