HIGH-RESOLUTION OCDR FOR TESTING INTEGRATED-OPTICAL WAVE-GUIDES - DISPERSION-CORRUPTED EXPERIMENTAL-DATA CORRECTED BY A NUMERICAL ALGORITHM

被引：52

作者：

KOHLHAAS, A ^{[1
]}

FROMCHEN, C ^{[1
]}

BRINKMEYER, E ^{[1
]}

机构：

[1] TECH UNIV HAMBURG,OPT SCI,HAMBURG,GERMANY

来源：

JOURNAL OF LIGHTWAVE TECHNOLOGY | 1991年 / 9卷 / 11期

关键词：

D O I：

10.1109/50.97637

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Micrometer resolution in reflectometric measurements for testing integrated optical devices cannot in general be maintained along the waveguides because of dispersion effects. Even for short waveguides with length of only a few centimeters the spatial resolution may be deteriorated by a factor of up to 100. A numerical algorithm is presented and applied to dispersion-corrupted experimental data taken by coherence domain reflectometric measurements. It results in a retrieval of micrometer resolution and an enhanced dynamic range.

引用

页码：1493 / 1502

页数：10

共 9 条

[1] HIGH-RESOLUTION OCDR IN DISPERSIVE WAVE-GUIDES [J].