HIGH-RESOLUTION OCDR FOR TESTING INTEGRATED-OPTICAL WAVE-GUIDES - DISPERSION-CORRUPTED EXPERIMENTAL-DATA CORRECTED BY A NUMERICAL ALGORITHM

Micrometer resolution in reflectometric measurements for testing integrated optical devices cannot in general be maintained along the waveguides because of dispersion effects. Even for short waveguides with length of only a few centimeters the spatial resolution may be deteriorated by a factor of up to 100. A numerical algorithm is presented and applied to dispersion-corrupted experimental data taken by coherence domain reflectometric measurements. It results in a retrieval of micrometer resolution and an enhanced dynamic range.