THE TECHNIQUE OF MEASURING MICROHARDNESS WITH THIN FILMS

被引:0
|
作者
PALATNIK, LS
FEDOROV, GV
KOSEVICH, VM
机构
来源
INDUSTRIAL LABORATORY | 1958年 / 24卷 / 06期
关键词
D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:857 / 859
页数:3
相关论文
共 50 条
  • [1] Thin films microhardness
    Ansaldi, A
    Ayllon, E
    Topolevsky, R
    ANALES DE LA ASOCIACION QUIMICA ARGENTINA, 1996, 84 (05): : 453 - 458
  • [2] Microhardness of thin solid films
    Navratil, V
    Stejskalova, V
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1996, 157 (02): : 339 - 344
  • [3] Microhardness of thin molybdenum films
    Navratil, V
    Sikola, T
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1997, 234 : 390 - 392
  • [4] Technique for Measuring Elastic Properties of Thin Biorelevant Films
    V. A. Zykova
    N. V. Surovtsev
    E. A. Dobrynina
    S. V. Adichtchev
    A. V. Laktionova
    Optoelectronics, Instrumentation and Data Processing, 2022, 58 : 109 - 113
  • [5] Technique for Measuring Elastic Properties of Thin Biorelevant Films
    Zykova, V. A.
    Surovtsev, N., V
    Dobrynina, E. A.
    Adichtchev, S., V
    Laktionova, A., V
    OPTOELECTRONICS INSTRUMENTATION AND DATA PROCESSING, 2022, 58 (02) : 109 - 113
  • [6] AN OPTICAL MICROSCOPE TECHNIQUE FOR MEASURING SWELLING OF THIN FILMS
    CHIKLIS, CK
    GRASSHOF.JM
    JOURNAL OF POLYMER SCIENCE PART A-2-POLYMER PHYSICS, 1969, 7 (9PA2) : 1619 - &
  • [7] A NEW TECHNIQUE FOR MEASURING THICKNESS OF THIN SOLID FILMS
    DESAI, CC
    CRYSTAL RESEARCH AND TECHNOLOGY, 1987, 22 (08) : 1079 - 1084
  • [8] A new technique for measuring the mechanical properties of thin films
    Sharpe, WN
    Yuan, B
    Edwards, RL
    JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 1997, 6 (03) : 193 - 199
  • [9] A method for measuring the microhardness of thin vacuum coatings
    Chumikov, AB
    Akif'ev, VA
    INDUSTRIAL LABORATORY, 2000, 66 (04): : 263 - 265
  • [10] TECHNIQUE FOR MEASURING THE ELEMENTARY PINNING FORCE IN THIN-FILMS
    ALLEN, LH
    CLAASSEN, JH
    PHYSICAL REVIEW B, 1989, 39 (04): : 2054 - 2059