X-RAY PHOTOELECTRON-SPECTROSCOPY OF SODIUM-PHOSPHATE GLASSES

被引：219
|
作者：
GRESCH, R [1 ]
MULLERWARMUTH, W [1 ]
DUTZ, H [1 ]
机构：
[1] JENAER GLASWERK SCHOTT GEN,MAINZ,FED REP GER
来源：
JOURNAL OF NON-CRYSTALLINE SOLIDS | 1979年 / 34卷 / 01期
关键词：
D O I：
10.1016/0022-3093(79)90012-7
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
X-ray photoelectron spectroscopy (XPS, ESCA) has been applied to sodium phosphate glasses with compositions between 15 and 50 mol% Na2O and for the purpose of comparison also to crystalline compounds containing oxygen and phosphorus. From the measurements a discrimination between bridging and non-bridging oxygen atoms was possible. The method provides a quantitative technique for structural analysis of phosphate glasses. © 1979.
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页码：127 / 136
页数：10
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