X-RAY PHOTOELECTRON-SPECTROSCOPY OF SODIUM-PHOSPHATE GLASSES

被引：220

作者：

GRESCH, R ^{[1
]}

MULLERWARMUTH, W ^{[1
]}

DUTZ, H ^{[1
]}

机构：

[1] JENAER GLASWERK SCHOTT GEN,MAINZ,FED REP GER

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1979年 / 34卷 / 01期

关键词：

D O I：

10.1016/0022-3093(79)90012-7

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

X-ray photoelectron spectroscopy (XPS, ESCA) has been applied to sodium phosphate glasses with compositions between 15 and 50 mol% Na2O and for the purpose of comparison also to crystalline compounds containing oxygen and phosphorus. From the measurements a discrimination between bridging and non-bridging oxygen atoms was possible. The method provides a quantitative technique for structural analysis of phosphate glasses. © 1979.

引用

页码：127 / 136

页数：10

共 8 条

[1]

BRION D, 1976, J MICROSC SPECT ELEC, V1, P227

[2]

CARLSON RA, 1975, PHOTOELECTRON AUGER

[3] X-RAY PHOTOELECTRON-SPECTROSCOPY AND APPLICATION TO PHOSPHORUS CHEMISTRY [J].