DESIGN METHODOLOGY FOR ANALOG MONOLITHIC CIRCUITS

被引:6
|
作者
HOSTICKA, BJ [1 ]
BROCKHERDE, W [1 ]
KLINKE, R [1 ]
KOKOZINSKI, R [1 ]
机构
[1] FRAUNHOFER INST MICROELECTR CIRCUITS & SYST, ANALOG INTEGRATED CIRCUIT DESIGN RES GRP, D-47057 DUISBURG, GERMANY
关键词
D O I
10.1109/81.296332
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This contribution describes an approach to design methodology for analog monolithic circuits. The underlying philosophy relies on use of three description domains-functional, structural, and geometrical-and two design tasks-synthesis and analysis. Based on this, the basic design path is described and several design styles are demonstrated. Finally, appropriate CAD and related issues are discussed.
引用
收藏
页码:387 / 394
页数:8
相关论文
共 50 条
  • [31] Analog design methodology using MATLAB
    Mahmoud, N
    Dessouky, M
    ICEEC'04: 2004 INTERNATIONAL CONFERENCE ON ELECTRICAL, ELECTRONIC AND COMPUTER ENGINEERING, PROCEEDINGS, 2004, : 465 - 468
  • [32] Methodology for design of multilayer microwave circuits
    Univ of Colorado at Boulder, Boulder, United States
    Int J RF Microwave Comput Aided Eng, 6 (455-473):
  • [33] A Straightforward Methodology for QCA Circuits Design
    Domingues Junior, Julio Saracol
    da Rosa Junior, Leomar Soares
    Marques, Felipe de Souza
    33RD SYMPOSIUM ON INTEGRATED CIRCUITS AND SYSTEMS DESIGN (SBCCI 2020), 2020,
  • [34] A methodology for design of multilayer microwave circuits
    Cho, C
    Gupta, KC
    INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING, 1998, 8 (06) : 455 - 473
  • [35] Fault-Based Test Methodology for Analog Amplifier Circuits
    Mikulic, Josip
    Sarson, Peter
    Schatzberger, Gregor
    Baric, Adrijan
    2017 IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS), 2017,
  • [36] On the methodology of assessing hot-carrier reliability of analog circuits
    Le, H
    Marcoux, PJ
    Jiang, WJ
    Chung, JE
    2000 IEEE INTERNATIONAL INTEGRATED RELIABILITY WORKSHOP FINAL REPORT, 2000, : 20 - 23
  • [37] Methodology to Improve Yield in Analog Circuits by Using Geometric Programming
    Saenz, Jorge Johanny
    Roa, Elkim
    Pabon, Armando Ayala
    Van Noije, Wilhelmus
    SBCCI 2010: 23RD SYMPOSIUM ON INTEGRATED CIRCUITS AND SYSTEMS DESIGN, PROCEEDINGS, 2010, : 140 - 145
  • [38] A Structured DC Analysis Methodology for Accurate Verification of Analog Circuits
    Javid, Farakh
    Iskander, Ramy
    Louerat, Marie-Minerve
    Durbin, Francois
    2013 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), 2013, : 2662 - 2665
  • [39] A Rare Event Based Yield Estimation Methodology for Analog Circuits
    Odabasi, Izel Cagin
    Yelten, Mustafa Berke
    Afacan, Engin
    Baskaya, Faik
    Pusane, Ali Emre
    Dundar, Gunhan
    2018 IEEE 21ST INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS (DDECS), 2018, : 33 - 38
  • [40] A USERS APPROACH TO DESIGN OF CUSTOM MONOLITHIC INTEGRATED CIRCUITS
    FEIT, JH
    HILBERT, FH
    DUNKLEY, JL
    IEEE TRANSACTIONS ON BROADCAST AND TELEVISION RECEIVERS, 1968, BT14 (03): : 25 - &