X-RAY-DIFFRACTION OF ALUMINUM NITRIDE AT HEAT-TREATMENT TEMPERATURE BETWEEN 20-DEGREES-C AND 1,200-DEGREES-C

被引：0

作者：

ANSART, F ^{[1
]}

YOKOGAWA, Y ^{[1
]}

TRAVERSE, JP ^{[1
]}

机构：

[1] NATL IND RES INST NAGOYA,KITA KU,NAGOYA 462,JAPAN

来源：

REVUE INTERNATIONALE DES HAUTES TEMPERATURES ET DES REFRACTAIRES | 1994年 / 29卷 / 02期

关键词：

D O I：

暂无

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

This paper concerns the study of the oxidation of the aluminium nitride at high temperature by X-ray diffraction. This coating is used in order to protect based-carbon composite materials against the oxidation. The X-ray diffraction method allows to follow the in-situ behavior of aluminium nitride under several thermal treatment conditions. The experimental device is used to follow the structural variations occuring in the samples during the heat treatment. Then, we present the evolution of the lattice parameters during the oxidation at high temperature.

引用

页码：49 / 53

页数：5

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