APPLICATION OF NONPARAMETRIC SIGN TEST TO SEQUENTIAL DETECTION

被引：0
|
作者：
ABEL, SW
BETTEN, JR
机构：
来源：
IEEE TRANSACTIONS ON INFORMATION THEORY | 1970年 / 16卷 / 01期
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D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
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页码：107 / +
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