APPLICATION OF NONPARAMETRIC SIGN TEST TO SEQUENTIAL DETECTION

被引：0

作者：

ABEL, SW

BETTEN, JR

机构：

来源：

IEEE TRANSACTIONS ON INFORMATION THEORY | 1970年 / 16卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：107 / +

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