THERMOMECHANICAL DATA-STORAGE USING A FIBER OPTIC STYLUS

被引:22
作者
HOEN, S
MAMIN, HJ
RUGAR, D
机构
[1] IBM Research Division, Almaden Research Center, San Jose, CA 95120-6099
关键词
D O I
10.1063/1.111176
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have developed a simple and fast surface modification technique for possible data storage applications. Writing is accomplished by heating the metallized tip of a tapered optical fiber with microsecond laser pulses. The heated tip, which is in contact with a polycarbonate substrate, creates a nanoindentation' Deflections of this same tip are used to detect the written marks, as in atomic force microscopy. The marks have sharp edges with 10%-90% transition widths of 0.2 mum, and have been written with laser pulses as short as 5 mus at repetition rates of 50 kHz. Readback has been performed over 300 kHz on a spinning sample. Substantial improvements in mechanical response and wear properties are seen compared to micromachined cantilevers.
引用
收藏
页码:267 / 268
页数:2
相关论文
共 17 条
[1]  
[Anonymous], 1986, THEORY ELASTICITY, DOI [DOI 10.1016/C2009-0-25521-8, 10.1016/C2009-0-25521-8]
[2]   LARGE-SCALE CHARGE STORAGE BY SCANNING CAPACITANCE MICROSCOPY [J].
BARRETT, RC ;
QUATE, CF .
ULTRAMICROSCOPY, 1992, 42 :262-267
[3]   NEAR-FIELD MAGNETOOPTICS AND HIGH-DENSITY DATA-STORAGE [J].
BETZIG, E ;
TRAUTMAN, JK ;
WOLFE, R ;
GYORGY, EM ;
FINN, PL ;
KRYDER, MH ;
CHANG, CH .
APPLIED PHYSICS LETTERS, 1992, 61 (02) :142-144
[4]  
Carslaw H. S., 1986, CONDUCTION HEAT SOLI
[5]  
Conway H.D., 1964, J APPL MECH-T ASME, V31, P329
[6]  
HOEN S, UNPUB
[7]   SUBMICROMETER MODIFICATION OF POLYMER SURFACES WITH A SURFACE FORCE MICROSCOPE [J].
JIN, X ;
UNERTL, WN .
APPLIED PHYSICS LETTERS, 1992, 61 (06) :657-659
[8]   THE ATOMIC FORCE MICROSCOPE USED AS A POWERFUL TOOL FOR MACHINING SURFACES [J].
JUNG, TA ;
MOSER, A ;
HUG, HJ ;
BRODBECK, D ;
HOFER, R ;
HIDBER, HR ;
SCHWARZ, UD .
ULTRAMICROSCOPY, 1992, 42 :1446-1451
[9]   MACHINING OXIDE THIN-FILMS WITH AN ATOMIC FORCE MICROSCOPE - PATTERN AND OBJECT FORMATION ON THE NANOMETER SCALE [J].
KIM, Y ;
LIEBER, CM .
SCIENCE, 1992, 257 (5068) :375-377
[10]   NANOMETER-SCALE LITHOGRAPHY USING THE ATOMIC FORCE MICROSCOPE [J].
MAJUMDAR, A ;
ODEN, PI ;
CARREJO, JP ;
NAGAHARA, LA ;
GRAHAM, JJ ;
ALEXANDER, J .
APPLIED PHYSICS LETTERS, 1992, 61 (19) :2293-2295