X-RAY-FLUORESCENCE AND QUANTITATIVE PARTICULATE MATTER ANALYSIS

X-ray fluorescence spectroscopy allows the quantitative analysis of a large number of chemical elements in the particulate matter found on filters, provided it can be considered as a thin layer With this aim, we have adjusted sampling procedures adapted to both the explored surroundings and specific criteria associated with the technique. Because of their transparency to the exciting X-rays, the analysis of thin films requires an optimization of the sample holder by the addition of a secondary cover We have previously studied the influence of the nature of this cover on the detection limit. Several calibration methods have been described in the literature and have been extensively used. We have looked into the problem of checking the stability between analysis sets and new calibration after an instrumental modification. A synthetic bulk reference sample can take into account the instrumental variations (current, tension applied to the generator). These bulk samples (with a pre-defined content) can be used as equivalent standard filters when an X-ray tube is changed. These quantitative analysis methods have been applied to the filtration of materials (geostandards) suspended in cyclohexane. This method gives quantitative results because the statistical deviations do not exceed 5%, whatever the element.