THICKNESS DEPENDENCE OF LIGHT-INDUCED DEGRADATION IN A-SI-H SOLAR-CELLS

被引：11
作者：
YANG, L
CHEN, LF
机构：
[1] Solarex Corporation, Thin Film Division, Newtown, PA 18940
来源：
JOURNAL OF NON-CRYSTALLINE SOLIDS | 1991年 / 137卷
关键词：
D O I：
10.1016/S0022-3093(05)80336-9
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The long term stability of a-Si:H solar cells as a function of i-layer thickness was investigated using the accelerated degradation test. It is demonstrated that stabilized efficiency improves substantially as the i-layer thickness decreases. The thickness dependences of the stabilized efficiency under the actual cell operating conditions were estimated using the kinetic model for the solar cell degradation.
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页码：1189 / 1192
页数：4
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