MICRO-CAMERA FOR X-RAY-DIFFRACTION ANALYSIS OF CRYSTALLINE DEFECTS IN GLASSES

被引:0
|
作者
HOLLAND, HJ [1 ]
机构
[1] CORNING GLASS WORKS,CORNING,NY 14830
来源
AMERICAN CERAMIC SOCIETY BULLETIN | 1976年 / 55卷 / 12期
关键词
D O I
暂无
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:1059 / 1061
页数:3
相关论文
共 50 条
  • [1] MODIFICATION OF X-RAY DIFFRACTION MICRO-CAMERA TO PERMIT STUDY OF LONG SPACINGS
    BERGMANN, ME
    FANKUCHEN, I
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1949, 20 (09): : 696 - 696
  • [2] NEW X-RAY-DIFFRACTION CAMERA
    RYBNIKAR, F
    CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1973, 23 (01): : 105 - 105
  • [3] QUANTITATIVE CRYSTALLINE PIGMENT ANALYSIS BY X-RAY-DIFFRACTION
    KAMARCHIK, P
    JOURNAL OF COATINGS TECHNOLOGY, 1980, 52 (666): : 79 - 82
  • [4] PRELIMINARY X-RAY-DIFFRACTION ANALYSIS OF CRYSTALLINE ECORI ENDONUCLEASE
    ROSENBERG, JM
    DICKERSON, RE
    GREENE, PJ
    BOYER, HW
    JOURNAL OF MOLECULAR BIOLOGY, 1978, 122 (02) : 241 - 245
  • [5] AN X-RAY-DIFFRACTION STUDY OF BISMUTHATE GLASSES
    DIMITRIEV, Y
    WRIGHT, AC
    MIHAILOVA, V
    GATTEF, E
    GUY, CA
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1995, 14 (05) : 347 - 350
  • [6] Caliste 64, an innovative CdTe hard X-ray micro-camera
    Meuris, A.
    Limousin, O.
    Lugiez, F.
    Gevin, O.
    Pinsard, F.
    Le Mer, I.
    Delagnes, E.
    Vassal, M. C.
    Soufflet, F.
    Bocage, R.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2008, 55 (02) : 778 - 784
  • [7] X-RAY-DIFFRACTION ANALYSIS
    RUIZ, P
    DELMON, B
    GARCIN, E
    SURANTYN, R
    VOLTA, JC
    GIMENEZ, MT
    NOGIER, JP
    THORET, J
    OUDET, F
    COURTINE, P
    DEBOER, M
    VANDILLEN, AJ
    GEUS, JW
    DELARCO, M
    MARTIN, C
    RIVES, V
    ANDERSSON, A
    MAJUNKE, AF
    BAERNS, M
    CATALYSIS TODAY, 1994, 20 (01) : 17 - 22
  • [8] CALISTE 64, an innovative CdTe hard X-ray micro-camera
    Meuris, A.
    Limousi, O.
    Lugiez, F.
    Gevin, O.
    Pinsard, F.
    Le Mer, I.
    Delagnes, E.
    Vassal, M. C.
    Soufflet, F.
    Bocage, R.
    2007 IEEE NUCLEAR SCIENCE SYMPOSIUM CONFERENCE RECORD, VOLS 1-11, 2007, : 2551 - +
  • [9] X-RAY-DIFFRACTION SPECTROMETRY FOR THE ANALYSIS OF CRYSTALLINE SOLID-PHASES
    GARCIA, JR
    SUAREZ, M
    GUARIDO, CG
    RODRIGUEZ, J
    ANALYTICAL CHEMISTRY, 1984, 56 (02) : 193 - 196
  • [10] TEMPERATURE-SCANNING X-RAY-DIFFRACTION CAMERA
    COAKLEY, CJ
    LYDON, JE
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1977, 10 (03): : 296 - 301