BEAM MONITOR FOR UNDULATOR WHITE RADIATION IN THE HARD-X-RAY RANGE

被引：8

作者：

FAJARDO, P ^{[1
]}

FERRER, S ^{[1
]}

机构：

[1] CSIC,INST CIENCIA MAT,E-08193 BARCELONA,SPAIN

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 02期

关键词：

D O I：

10.1063/1.1145812

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In this paper an instrument for white x-ray beam monitoring suitable for experiments with undulator beams at ESRF is presented. It is based on a 500 μm thick beryllium single crystal that is interposed in the beam. Information about the shape and position of the beam is obtained from the image of a Bragg reflection recorded by an x-ray camera. When the position is determined from a single video frame, the resolution is about 10 μm. The mosaic spread and the defects of the beryllium crystal degrade the fidelity of the beam images but do not affect the resolution of the instrument as a position monitor. The major limitation comes from the unavailability of large enough Be crystals of good quality. © 1995 American Institute of Physics.

引用

页码：1879 / 1881

页数：3

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