2 SIMPLE METHODS FOR THE MEASUREMENT OF THE DIELECTRIC PERMITTIVITY OF LOW-LOSS MICROSTRIP SUBSTRATES

被引：16
|
作者：
PANNELL, RM [1 ]
JERVIS, BW [1 ]
机构：
[1] PLYMOUTH POLYTECH,DEPT COMMUN ENGN,PLYMOUTH PL4 8AA,DEVONSHIRE,ENGLAND
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1981年 / 29卷 / 04期
关键词：
D O I：
10.1109/TMTT.1981.1130362
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：383 / 386
页数：4
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