EVIDENCE OF SCREENING CHARGE DEPRESSION IN VICINITY OF CHROMIUM AND MANGANESE IMPURITIES IN ALUMINUM AT LOW-TEMPERATURE

被引：20

作者：

BERTHIER, C ^{[1
]}

MINIER, M ^{[1
]}

机构：

[1] UNIV SCI & MED GRENOBLE,CNRS,LAB SPEC PHYS,38041 GRENOBLE,FRANCE

来源：

JOURNAL OF PHYSICS F-METAL PHYSICS | 1973年 / 3卷 / 06期

关键词：

D O I：

10.1088/0305-4608/3/6/013

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1169 / 1177

页数：9

共 31 条

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