Scherrer formula: estimation of error in determining small nanoparticle size

被引:60
作者
Vorokh, A. S. [1 ]
机构
[1] Russian Acad Sci, Ural Branch, Inst Solid State Chem, 91 Pervomaiskaya St, Ekaterinburg, Russia
来源
NANOSYSTEMS-PHYSICS CHEMISTRY MATHEMATICS | 2018年 / 9卷 / 03期
基金
俄罗斯科学基金会;
关键词
Scherrer formula; nanoparticle size; Scherrer limit; Debye equation;
D O I
10.17586/2220-8054-2018-9-3-364-369
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The lower limit of the applicability of the Scherrer formula has been established by calculating the diffraction patterns from model nanoparticles by the Debye formula. Particle size was calculated using the Scherrer formula for different hkl-peaks. The obtained data of particle sizes were compared with "real" sizes of model particles in the same hkl-directions. The form-factor K-hkl was analyzed as main correction of Scherrer formula. It was shown that the Scherrer formula error increases nonlinearly at particle sizes less than 4 nm. For any hkl direction, the absolute error of average particle size determination using formula does not exceed 0.3 nm. Analysis shows that average particle size can be determined by Scherrer formula from single diffraction peak of experimental pattern for center-symmetrical particles.
引用
收藏
页码:364 / 369
页数:6
相关论文
共 25 条
[1]  
[Anonymous], 1974, INT TABLES XRAY CRYS
[2]   DEBUSSY 2.0: the new release of a Debye user system for nanocrystalline and/or disordered materials [J].
Cervellino, Antonio ;
Frison, Ruggero ;
Bertolotti, Federica ;
Guagliardi, Antonietta .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2015, 48 :2026-2032
[3]  
Debye P, 1915, ANN PHYS-BERLIN, V46, P809
[4]   Routine (an)isotropic crystallite size analysis in the double-Voigt approximation done right? [J].
Ectors, D. ;
Goetz-Neunhoeffer, F. ;
Neubauer, J. .
POWDER DIFFRACTION, 2017, 32 :S27-S34
[5]   Estimating nanoparticle size from diffraction measurements [J].
Hall, BD ;
Zanchet, D ;
Ugarte, D .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2000, 33 :1335-1341
[6]   New measures of sharpness for symmetric powder diffraction peak profiles [J].
Ida, Takashi .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2008, 41 :393-401
[7]   X-ray scattering characterisation of nanoparticles [J].
Ingham, Bridget .
CRYSTALLOGRAPHY REVIEWS, 2015, 21 (04) :229-303
[8]  
James R, 1948, OPTICAL PRINCIPLES D
[9]   SCHERRER AFTER 60 YEARS - SURVEY AND SOME NEW RESULTS IN DETERMINATION OF CRYSTALLITE SIZE [J].
LANGFORD, JI ;
WILSON, AJC .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1978, 11 (APR) :102-113
[10]   The Scherrer equation and the dynamical theory of X-ray diffraction [J].
Leitao Muniz, Francisco Tiago ;
Ribeiro Miranda, Marcus Aurelio ;
dos Santos, Cassio Morilla ;
Sasaki, Jose Marcos .
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2016, 72 :385-390