OSCILLATOR-STRENGTH PARAMETERIZATION OF INNER-SHELL CROSS-SECTIONS

被引:29
作者
EGERTON, RF
机构
[1] Physics Department, University of Alberta, Edmonton
关键词
D O I
10.1016/0304-3991(93)90087-E
中图分类号
TH742 [显微镜];
学科分类号
摘要
We present a compilation of dipole oscillator strengths f(DELTA) for ionization of K, L, M, N and O atomic shells, integrated over an energy range DELTA (typically 100 eV) above the ionization threshold. The information was derived from Hartree-Slater calculations, photoabsorption data and measurements by electron energy-loss spectroscopy (EELS). In the case of M-, N- and O-edges, experimental values considerably exceed the Hartree-Slater predictions. From an assessment of the data, we suggest values of f(DELTA) for use in elemental analysis by EELS in the transmission electron microscope.
引用
收藏
页码:13 / 28
页数:16
相关论文
共 46 条
[1]   INNER SHELL EDGE PROFILES IN ELECTRON-ENERGY LOSS SPECTROSCOPY [J].
AHN, CC ;
REZ, P .
ULTRAMICROSCOPY, 1985, 17 (02) :105-115
[2]   A COMPARISON OF THEORETICAL AND EXPERIMENTAL L-CROSS AND M-CROSS SECTIONS [J].
AUERHAMMER, J ;
REZ, P ;
HOFER, F .
ULTRAMICROSCOPY, 1989, 30 (03) :365-370
[3]   THE FORWARD X-RAY-SCATTERING FACTOR OF COPPER FROM A SELF-CONSISTENT DATA-BASE [J].
BARKYOUMB, JH ;
MORRISON, TI ;
SMITH, DY .
PHYSICS LETTERS A, 1990, 143 (09) :462-466
[4]   X-RAY-SCATTERING FACTORS OF METALLIC ALUMINUM CALCULATED FROM A SELF-CONSISTENT X-RAY ATTENUATION DATA-BASE [J].
BARKYOUMB, JH ;
SMITH, DY .
PHYSICAL REVIEW A, 1990, 41 (09) :4863-4867
[5]   AEM CHARACTERIZATION OF SINTERED SILICON-NITRIDE WITH YTTRIA AND ALUMINA ADDITIONS [J].
CHADWICK, MM ;
MALIS, TF .
ULTRAMICROSCOPY, 1989, 31 (02) :205-216
[6]   MEASUREMENT OF INELASTIC ELECTRON-SCATTERING CROSS-SECTIONS BY ELECTRON ENERGY-LOSS SPECTROSCOPY [J].
CROZIER, PA .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1990, 61 (03) :311-336
[7]  
CUKIER M, 1978, J PHYS LETT-PARIS, V39, pL315, DOI 10.1051/jphyslet:019780039018031500
[8]   RESONANCES IN NEAR-THRESHOLD X-RAY PHOTOABSORPTION OF INNER SHELLS [J].
DELGRANDE, NK ;
TIRSELL, KG ;
SCHNEIDER, MB ;
GARRETT, RF ;
KNEEDLER, EM ;
MANSON, ST .
JOURNAL DE PHYSIQUE, 1987, 48 (C-9) :951-954
[9]   QUANTITATIVE-ANALYSIS OF ELECTRON-ENERGY-LOSS SPECTRA [J].
EGERTON, RF .
ULTRAMICROSCOPY, 1989, 28 (1-4) :215-225
[10]   K-SHELL IONIZATION CROSS-SECTIONS FOR USE IN MICROANALYSIS [J].
EGERTON, RF .
ULTRAMICROSCOPY, 1979, 4 (02) :169-179